2014_1_3

Title of the article

THE RISK OF FAILURE OF COMPLEX TECHNICAL SYSTEMS

Authors

Yurkov Nikolay Kondrat'evich doctor of technical sciences, professor, head of sub-department of radio equipment design and production, Penza State University

Index UDK

658.5

Abstract

The mechanism of formation of latent defects in printed circuit boards, the mathematical model of the development of a latent defect in the clear on the basis of the risk function, which allows to determine the average time until the next defect electronic means of complex technical systems. A model of the risk function as an offset of the Chebyshev polynomial. Establish the validity of the methodology of calculating the reliability of software for assessing the reliability of complex technical systems, long-term operation.

Key words

model, defect, reliability, safety, risk, diagnosis, complex technical system.

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Дата создания: 04.04.2015 21:34
Дата обновления: 04.04.2015 21:34